Used and refurbished Surfscan 6100, 6220 and 6420 unpatterned wafer inspection systems, with laser upgrades, refurbishment and parts contracts for Surfscan 6100, 6200 and 6400 series tools.
A KLA-Tencor Surfscan is a laser-scanning unpatterned wafer surface inspection system (SSIS), often called a wafer particle counter. It detects, counts, sizes and maps particles (light point defects) and measures haze (surface roughness) on bare silicon wafers. Our refurbished Surfscan systems detect particles from ≈ 204 nm down to ≈ 100 nm at a 95% capture rate, with a red 632 nm HeNe or a blue 488 nm solid state laser, and particle sizing referenced to NIST-traceable PSL wafer standards.
| Feature | Surfscan 6100 Upgraded | Surfscan 6100 Enhanced | Surfscan 6100 Ultimate | Surfscan 6220 Ultimate | Surfscan 6420 Ultimate |
|---|---|---|---|---|---|
| Particle detection | ≈ 0.204 µm (204 nm) at 95% capture rate | ≈ 0.16 µm (160 nm) at 95% capture rate | ≈ 0.16 µm (160 nm) at 95% capture rate | ≈ 0.12 µm (120 nm) at 95% capture rate | ≈ 0.100 µm (100 nm) at 95% capture rate |
| Laser | Red 632 nm HeNe, gas tube laser | New, red 632 nm HeNe, gas tube laser | New, red 632 nm HeNe, gas tube laser | New, blue, solid state 488 nm laser | New, blue, solid state 488 nm laser |
| Haze | Yes, customer calibrates | Yes, customer calibrates | Haze down to 0.02 ppm, resolution @ 0.002 ppm | Haze down to 0.02 ppm, resolution @ 0.002 ppm | Haze down to 0.02 ppm, resolution @ 0.002 ppm |
| SECS/GEM data output | Optional | Optional | Optional | Yes, SECS/GEM data protocol installed | Yes, SECS/GEM data protocol installed |
| Warranty | 6 months optional, travel not included | 6 months optional, travel not included | 6 months included; extended optional, travel not included | 1 year included; extended optional, travel not included | 1 year included; extended optional, travel not included |
The Surfscan 6420 Ultimate, at ≈ 0.10 µm (100 nm) at a 95% capture rate on bare silicon. The Surfscan 6220 Ultimate reaches ≈ 0.12 µm (120 nm).
The Surfscan 6100. Its red 632 nm HeNe laser keeps particle data in line with Surfscan 4500 and 5500 tools.
SECS/GEM is installed on the 6220 and 6420 Ultimate and optional on the Surfscan 6100 Upgraded, Enhanced and Ultimate.
Particle size response is calibrated with NIST-traceable PSL calibration wafer standards. The Ultimate models include full-deposition calibration wafers.
Yes. For Surfscan 6100, 6200 and 6400 series tools we offer a solid state laser upgrade to replace the argon laser, a full refurbishment service and an annual parts contract.